Our laboratory excels in polarization metrology, a specialized field focused on measuring, analyzing,
and reconstructing the polarization properties of light as it interacts with materials. Our instruments
cover a comprehensive range of wavelengths, spanning the full visible light spectrum and extending into
the near-infrared (NIR) region, specifically 1500-1600 nm and the 3.39 micron HeNe line. Addition-
ally, our instruments incorporate goniometric motion allowing for measurement of the Mueller matrix
bidirectional reflectance distribution function (BRDF). This allows us to detect subtle variations in
material properties with exceptional sensitivity. Through precise analysis of polarization changes,
we can accurately map stress distributions within materials, critically evaluate optical components
to ensure compliance with stringent performance standards, and meticulously inspect manufactured
parts for adherence to exact specifications. Our state-of-the-art capabilities in polarization metrology
support a wide array of industrial and research applications.